Concord, California, Feb. 21, 2023 (GLOBE NEWSWIRE) -- CDM Smith is pleased to announce that Ian Ross has joined the firm as a senior vice president and the new PFAS practice leader. Ross has been ...

This file type includes high resolution graphics and schematics when applicable. EOS and ESD may be caused by the user’s application due to a transient, excessive supply current, poor grounding, low ...

Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...