The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

With every passing day the Mule provides opportunities beyond our original expectations. Since the 467ci engine belongs to HPP editor Tom DeMauro, it is at our beck and call. This affords HPP the ...

Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...

Your engine is simpler than you think and only four things separate it from becoming a good-for-nothing lump of aluminum: fuel, air, spark and compression. Smoke billowing from the back of your hoopty ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Design automation is the key to the development of very large ICs. Optimizing the connection and layout of millions of gates to efficiently perform complex functions is not a job to which humans are ...

During the late 1960s and most of the 1970s, the composites industry was absorbing the impact of what was then the recent introduction of carbon fiber. The resulting composites exhibited both high ...