Point defects (e.g. missing, extra or swapped atoms) in crystalline materials often determine the actual electronic and optical response of a given material. For example, controlled substitutions in ...

Researchers show that Cartan's First Structure Equation links crystal defects to the same mathematical rules governing electric currents and magnetic fields. (Nanowerk News) A fundamental goal of ...

Half-Heusler Ni-based alloys are thermoelectric materials with the potential for converting waste heat into electricity. However, the origin of their impressive conversion efficiency is not entirely ...

Imperfections of crystal structure, especially edge dislocations of an elongated nature, deeply modify basic properties of the entire material and, in consequence, drastically limit its applications.

The study of curvature effects on crystal structures and defect dynamics offers pivotal insights into how geometric constraints influence material properties at the micro‐ and nanoscale. Curved ...

Researchers have explored a 'quantum-inspired' technique to make the 'ones' and 'zeroes' for classical computer memory applications out of crystal defects, each the size of an individual atom. This ...

Perovskites are among the most extensively studied materials in modern materials science. Their often unique and exotic properties, which stem from perovskite’s peculiar crystal structure, could find ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Insights into atomic-scale defects may enable next-generation thin-film transistors for smartphones, televisions, and flexible electronics. (Nanowerk News) Many displays found in smartphones and ...

Forward-looking: Researchers at the University of Chicago have achieved a groundbreaking milestone, storing terabytes of digital data within a crystal cube just one millimeter in size. They ...

Inspection and metrology are becoming more critical in the silicon carbide (SiC) industry amid a pressing need to find problematic defects in current and future SiC devices. Finding defects always has ...