The introduction of several new dielectric materials for high-speed ultra-large-scale integration (ULSI) microelectronics has increased the necessity for metrology tools to measure the ...

The measured ellipsometric parameters (Ψ and Δ) include the physical properties of the layer structure being analyzed. This information shows the layer thickness and refractive index concerning the ...

The physical properties of the layer structure being analyzed are included in the measured ellipsometric parameters (Ψ and Δ). This information exhibits the layer thickness and refractive index ...

Multilayer dielectric stacks are used in various applications that demand accurate optical filtration, such as the military, aerospace, architectural glass, and all forms of optical metrology ...

Engineers and material scientists have been trying to develop increasingly advanced devices, to meet the growing needs of the electronics industry. These devices include electrostatic capacitors, ...

New precision nanolayer platform engineers breakthrough barrier, dielectric, and mechanical performance for medical, food and beverage packaging, power systems, and defense.

Just as circuit metallization must evolve to manage resistance as features shrink, so must the dielectric half of the interconnect stack. For quite some time, manufacturers have needed a dielectric ...

A research group has used nanosheet technology to develop a dielectric capacitor for advanced electronic and electrical power systems. Innovations in energy storage technology are vital for the ...

Peak Nano, a pioneer in polymer metamaterials for capacitor films, packaging, and other demanding applications, today ...