Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

Responsive technique: Jonathan Peters using an electron microscope at Trinity College Dublin (Courtesy: Lewys Jones and Jonathan Peters/Trinity College Dublin) A new scanning transmission electron ...

Our ability to image the subatomic realm is limited, not just by resolution, but also by speed. The constituent particles that make up – and fly free from – atoms can, in theory, move at speeds ...

Materials data scientist Steve Spurgeon and his colleagues at PNNL use an artificial intelligence approach known as deep learning to develop models that can quickly and automatically identify patterns ...

Thanks to advanced image acquisition and automated aberration correction techniques, researchers managed to measure magnetic fields in Ba 2 FeMoO 6 at a groundbreaking resolution of 0.47 nm for a ...

They can image a wide range of materials and biological samples with high magnification, resolution, and depth of field, thereby revealing surface structure and chemical composition. Industries like ...