KLA-Tencor Corporation Introduces Comprehensive Wafer Inspection and Review Portfolio for Leading IC Technologies
KLA-Tencor Corporation Introduces Comprehensive Wafer Inspection and Review Portfolio for Leading IC Technologies
Jul 11, 2016
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Media Room | Videos from KLA | KLA
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Media Room | Videos from KLA | KLA
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The largest developments in modern technology are built using the smallest integrated circuits. These advanced semiconductor chips are manufactured using state of the art processes that need to be monitored and controlled. Introducing our new PWG5™ patterned wafer geometry and nanotopography system! Inline process monitoring and data feed forward using the PWG5 provides overlay and lithography focus window control, while process feedback accelerates R&D and improves yield for high volume manufac
1:35
The largest developments in modern technology are built using the smallest integrated circuits. These advanced semiconductor chips are manufactured using state of the art processes that need to be monitored and controlled. Introducing our new PWG5™ patterned wafer geometry and nanotopography system! Inline process monitoring and data feed forward using the PWG5 provides overlay and lithography focus window control, while process feedback accelerates R&D and improves yield for high volume manufac
615 viewsDec 15, 2020
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PWG5™: The Complete Wafer Geometry System for IC Fabs | Innovation | KLA
PWG5™: The Complete Wafer Geometry System for IC Fabs | Innovation | KLA
Dec 8, 2020
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KLA Tencor
KLA Tencor
4 months ago
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KLA Corporation Announces the Revolutionary eSL10 E-Beam Patterned-Wafer Defect Inspection System
KLA Corporation Announces the Revolutionary eSL10 E-Beam Patterned-Wafer Defect Inspection System
Jul 20, 2020
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Announcing our new 8930 high productivity patterned wafer defect inspection system! To support key inspection needs for the IoT, 5G and automotive IC segments, the 8930 quickly and reliably finds and identifies critical defects, supporting a variety of applications where process issue resolution requires high-speed and high-sampling inspection. Learn more: https://www.kla-tencor.com/products/chip-manufacturing/defect-inspection-review#product-8-series | KLA Corporation
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Announcing our new 8930 high productivity patterned wafer defect inspection system! To support key inspection needs for the IoT, 5G and automotive IC segments, the 8930 quickly and reliably finds and identifies critical defects, supporting a variety of applications where process issue resolution requires high-speed and high-sampling inspection. Learn more: https://www.kla-tencor.com/products/chip-manufacturing/defect-inspection-review#product-8-series | KLA Corporation
845 viewsFeb 13, 2020
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Semiconductor chips are at the core of the technologies keeping us connected. For these chips to function properly, pattern features must be correctly aligned from layer to layer during manufacturing. Our new Archer™ 750 overlay metrology system monitors pattern alignment, helping fabs produce high performance, reliable logic and memory devices. Learn more here: https://www.kla.com/archer-spectrashape-metrology | KLA Corporation
1.1K viewsApr 6, 2020
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Meet our eSL10™ e-beam patterned wafer defect inspection system! With multiple revolutionary e-beam technologies, the eSL10 captures many types of defects across a range of process layers and device architectures, helping accelerate time to market for high-performance logic and memory chips. Learn more at: https://www.kla.com/esl10-ebeam-inspection | KLA Corporation
1.3K viewsJul 20, 2020
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Surfscan® SP7XP: Detecting Defects Drives Pristine Processes | Innovation | KLA
Dec 8, 2020
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Shape-induced overlay for wafer-to-wafer hybrid bonding
Apr 24, 2025
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Achieve ‘Zero Tolerance’ Die Sorting with ICOS™ F260 | Innovation | KLA
Sep 13, 2022
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KLA Archer 750 & SpectraShape 11k | KLA
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KLA is proud to sponsor and exhibit at #SEMICONEuropa in Munich, November 18–21. Visit us at Booth B1141 to explore our latest process control and wafer processing solutions, and join Richard Barnett’s talk on November 18 at 4:10 pm: “Plasma Etch and Deposition for III-Vs: Driving Performance in Photonics, RF and Power Applications” during the III-V Summit. Come join us and discover what we're all about! https://bit.ly/4qWPASA #KLAatSEMICON | KLA Corporation
335 views6 months ago
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Spot sale KLA-Tencor KLA wafer defect detection data control board IDA5GV2 0738798-002 0840197-001
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